X-Ray Diffraction Topography

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Bibliographic Details
Main Author: Tanner, Brian Keith
Format: Book
Language:English
Published: Oxford [usw.], Frankfurt Pergamon Pr. 1976
Series:International Series in the science of the solid state 10
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041 |a eng 
100 1 |a Tanner, Brian Keith 
245 1 0 |a X-Ray Diffraction Topography 
246 3 |a TANNER,B(rian) K(eith): 
264 1 |a Oxford [usw.], Frankfurt  |b Pergamon Pr.  |c 1976 
300 |a XIII, 174 S.  |b mit zahlr. Fig.  |c 4° 
490 0 |a International Series in the science of the solid state  |v 10 
500 |a T 20.473/10 -- TANNER,B(rian) K(eith): -- X-Ray Diffraction Topography. - Oxford -- [usw.],Frankfurt:Pergamon Pr.(1976).XIII, -- 174 S.mit zahlr.Fig. 4° -- (International Series in the science of the -- solid state.lo.) -- 1977:B 1005/gb. -- [Ersatz] Ko.° 
852 |c T 20.473/10 
999 |a Monographie