Automatic Generation of functional test patterns from RT language source

Saved in:
Bibliographic Details
Main Author: Hartenstein, Reiner W.
Other Authors: Wodtko, Andrea
Format: Book
Language:English
Published: Kaiserslautern 1985
Series:Fachbereich Informatik, Univ. Kaiserslautern. Interner Bericht 131
Tags: Add Tag
No Tags, Be the first to tag this record!
Order eBook:
Order Book: Login to order